발행물
컨퍼런스
Optics & Photonics Taiwan, International Conference 2016
2016
,
Spectroscopic imaging ellipsometry for measurement the multi-layer film thickness
Development of temporal coherent pulse combining module
3D large step surface profile measurements by dual low coherence scanning interferometry
ICPT2016
Development of compact coherent pulse combining module
Multi-layer film thickness measurements by spectroscopic imaging ellipsometry