발행물
컨퍼런스
The 9th international Symposium on Measurement Technology and Intelligent Instruments
2009
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Double-sided interferometer with low drift for stability testing
A simple heterodyne laser interferometer without periodic errors
The 9th euspen International Conference
Wavelength corrected, heterodyne interferometry in air
23rd ASPE annual meeting
2008
Uncertainty considerations for interferometric stability Testing
SPIE Optics Photonics
Surface Metrology of Silicon Wafers using a Femtosecond Pulse Laser