발행물
컨퍼런스
62nd Electronic Components and Technology Conference (ECTC)
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Thermal Effects on Through-Silicon-Via (TSV) Signal Integrity
Vertical Tree 3-dimensional TSV Clock Distribution Network in 3D IC
Nonlinear Effects of TSV and Harmonic Generation
Effects of On-Chip Decoupling Capacitors and Silicon Substrate on Power Distribution Networks in TSV-based 3D-Ics
High-frequency Measurements of TSV failures