Modeling and Analysis of Through-Silicon Via (TSV) Noise Coupling and Suppression Using a Guard Ring
Cho, JH[Cho, Jong-Hyun], Song, EH[Song, Eak-Hwan], Yoon, KH[Yoon, Ki-Hyun], Pak, JS[Pak, Jun-So], Kim, JH[Kim, Joo-Hee], Lee, WJ[Lee, Woo-Jin], Song, TG[Song, Tai-Gon], Kim, KY[Kim, Ki-Yeong], Lee, JH[Lee, Jun-Ho], Lee, HD[Lee, Hyung-Dong], Park, KW[Park, Kun-Woo], Yang, ST[Yang, Seung-Taek], Suh, MS[Suh, Min-Suk], Byun, KY[Byun, Kwang-Yoo], Kim, Joung-Ho
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 201102