Chip-Level Simultaneous Switching Current Measurement in Power Distribution Network Using Magnetically Coupled Embedded Current Probing Structure
Kim, JJ[Kim, Jonghoon J.], Cho, C[Cho, Changhyun], Bae, B[Bae, Bumhee], Kim, SJ[Kim, Suk Jin], Kong, SK[Kong, Sunkyu], Kim, HG[Kim, Hee-Gon], Jung, DH[Jung, Daniel Hyunsuk], Kim, JS[Kim, Ji-Seong], Kim, Joung-Ho
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 201412