K.-S. Lee et al., IEEE Trans. Electron Devices, 2023
K.-S. Lee
IEEE Trans. Electron Devices, 2023
22
Device Optimization for Short-channel Effects Suppression in UFETs
왕동현, 정대한, 이광선, 구자윤, 윤성수, 박준영
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2023
23
Improvement of Device Reliability and Variability Using High Pressure Deuterium Annealing
박준영, 정대한, 윤성수, 구자윤, 왕동현, 이광선
Transactions on Electrical and Electronic Materials, 2023
24
Through-Silicon Via를 활용한 3D NAND Flash Memory의 전열 어닐링 발열 균일성 개선
박준영, 손영서, 이광선, 김유진
전기전자재료학회논문지, 2023
25
Low-temperature deuterium annealing for improved electrical characteristics of SONOS
박준영, 정대한, 윤성수, 왕동현, 구자윤, 길태현, 김동호
MICROELECTRONICS RELIABILITY, 2023
26
Improved SOI FinFETs Performance With Low-Temperature Deuterium Annealing
최양규, 한준규, 정대한, 왕동현, 유지만, 구자윤, 박준영
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023
27
Lowering of Schottky Barrier Height in a Vertical Pillar MOSFET by Deuterium Annealing
최양규, 윤성윤, 한준규, 왕동현, 유지만, 박준영
IEEE ELECTRON DEVICE LETTERS, 2023
28
Impact of device-to-device interference in nanosheet field-effect transistors
박준영, 이광선, 신우철, Ju-Won Yeon
MICROELECTRONICS RELIABILITY, 2023
29
Comprehensive Study on Trap-Induced Bias Instability via High-Pressure <i>D</i><sub>2</sub> and <i>N</i><sub>2</sub> Annealing
박준영, 구자윤, 이광선, 정대한, 왕동현, 오세영, 이기영, 조병진, 배학열
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2023
30
Low-Temperature Deuterium Annealing for the Recovery of Ionizing Radiation-Induced Damage in MOSFETs
박준영, 왕동현, 윤성수, 구자윤, 정대한, 이광선, 김동호
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2023