발행물

전체 논문

90

61

A Comparative Study of the Curing Effects of Local and Global Thermal Annealing on a FinFET
박준영, 이건범, 최양규
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2019

62

Nanoscale FET-Based Transduction toward Sensitive Extended-Gate Biosensors
박준영, 권재, 이병현, 김성연, 배학열, 최양규, 안재혁
ACS SENSORS, 2019

63

Power reduction for recovery of a FinFET by electrothermal annealing
박준영, 한준규, 최양규
SOLID-STATE ELECTRONICS, 2019

64

Electro-Thermal Erasing at 10(4)-Fold Faster Speeds in Charge-Trap Flash Memory
박준영, 김명수, 안대철, 서명수, 김성연, 김우강, 윤대환, 최양규
IEEE ELECTRON DEVICE LETTERS, 2018

65

Suppression of Self-Heating Effects in 3-D V-NAND Flash Memory Using a Plugged Pillar-Shaped Heat Sink
박준영, 윤대환, 김성연, 최양규
IEEE ELECTRON DEVICE LETTERS, 2018

66

A Recoverable Synapse Device Using a Three-Dimensional Silicon Transistor
박준영, 허재, 장병철, 박지훈, 문동일, 배학열, 김건희, 전승배, 서명수, 김성호, 최성율, 최양규
ADVANCED FUNCTIONAL MATERIALS, 2018

67

Self-powered data erasing of nanoscale flash memory by triboelectricity
박준영, 진익경, 이병현, 전승배, 초일웅, 박상재, 김원국, 한준규, 이승욱, 김성연, 배학열, 김대원, 최양규
NANO ENERGY, 2018

68

On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments
박준영, 김원국, 배학열, 진익경, 김다진, 임훤, 초일웅, 최양규
SCIENTIFIC REPORTS, 2018

69

Electrothermal Annealing to Enhance the Electrical Performance of an Exfoliated MOS2 Field-Effect Transistor
박준영, 한준규, 김충기, 권정현, 김명수, 황병운, 김다진, 최경철, 최양규
IEEE ELECTRON DEVICE LETTERS, 2018

70

Sanitization of Data in Nanoscale Flash Memory by Thermal Erasing and Reuse of Storage
박준영, 문동일, 김성연, 임훤, 장기수, 정찬배, 최양규
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2018