발행물

전체 논문

90

71

Demonstration of a Curable Nanowire FinFET Using Punchthrough Current to Repair Hot-Carrier Damage
박준영, 허재, 최양규
IEEE ELECTRON DEVICE LETTERS, 2018

72

A Comparative Study on Hot-Carrier Injection in 5-Story Vertically Integrated Inversion-Mode and Junctionless-Mode Gate-All-Around MOSFETs
박준영, 김성연, 최양규, 이승욱, 이병현, 허재, 전승배
IEEE ELECTRON DEVICE LETTERS, 2018

73

Localized Electrothermal Annealing with Nanowatt Power for a Silicon Nanowire Field-Effect Transistor
박준영, 이병현, 이건범, 배학열, 최양규
ACS APPLIED MATERIALS & INTERFACES, 2018

74

Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments
황규만, 배학열, 이승욱, 김충기, 서명수, 임훤, 김도현, 김성연, 이건범, 최양규, 박준영
ACS NANO, 2017

75

LF Noise Analysis for Trap Recovery in Gate Oxides Using Built-In Joule Heater
박준영, 전창훈, 김충기, 정의식, 이병현, 김경록, 최양규
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017

76

Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels
박준영, 이병현, 장기수, 김동욱, 정찬배, 김충기, 배학열, 최양규
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017

77

Functional Circuitry on Commercial Fabric via Textile-Compatible Nanoscale Film Coating Process for Fibertronics
장병철, 박홍근, 정수호, 이해문, 전승배, 손경호, 초일웅, 유경식, 임성갑, 최성율, 최양규, 박준영, 배학열
NANO LETTERS, 2017

78

Electro-Thermal Annealing Method for Recovery of Cyclic Bending Stress in Flexible a-IGZO TFTs
박준영, 이명근, 김충기, 박정우, 김응택, 설명록, 최양규, 박상희, 최경철
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017

79

A Novel Technique for Curing Hot-Carrier-Induced Damage by Utilizing the Forward Current of the PN-Junction in a MOSFET
박준영, Geon-Beom Lee, Choong-Ki Kim, Tewook Bang, Hagyoul Bae, Seong-Yeon Kim, Seung-Wan Ryu, Yang-Kyu Choi
IEEE ELECTRON DEVICE LETTERS, 2017

80

Improved Technique for Extraction of Effective Mobility by Considering Gate Bias-Dependent Inversion Charges in a Floating-Body Si/SiGe pMOSFET
박준영, Hagyoul Bae, Tewook Bang, Choong-Ki Kim, Jae Hur, Seyeob Kim, Chang-Hoon Jeon, Dae-Chul Ahn, Gun-Hee Kim, Yunik Son, Jae-Hoon Lee, Yong-Taik Kim, Seong-Wan Ryu, Yang-Kyu Choi
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2017