Analysis of Program Characteristics in V-NAND with Varying Dimple Length
Seongwoo Kim, Myounggon Kang
Journal of the Institute of Electronics and Information Engineers, 2025
12
Analysis of Bias Temperature Instability in Peripheral CMOS Devices for Low-Temperature Memory Applications
Jung Rae Cho, Seungwon Go, Jingyu Park, Tae Jun Yang, Seonhaeng Lee, Namhyun Lee, Dong Keun Lee, Yoon Kim, Myounggon Kang, Rock‐Hyun Baek, Changhyun Kim, Sangwan Kim, Dae Hwan Kim