발행물

전체 논문

233

21

Analyzing Various Structural and Temperature Characteristics of Floating Gate Field Effect Transistors Applicable to Fine-Grain Logic-in-Memory Devices
Sangki Cho, Sueyeon Kim, Myounggon Kang, Seung-Jae Baik, Jongwook Jeon
Micromachines, 2024

22

An Optimized Device Structure with a Highly Stable Process Using Ferroelectric Memory in 3D NAND Flash Memory Applications
Seonjun Choi, Myounggon Kang, Hong-sik Jung, Yuri Kim, Yun‐Heub Song
Electronics, 2024

23

Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning
Jun Hui Park, Jung Nam Kim, Seonhaeng Lee, Gang-Jun Kim, Namhyun Lee, Rock‐Hyun Baek, Dae Hwan Kim, Changhyun Kim, Myounggon Kang, Yoon Kim
IEEE Access, 2024

24

The Optimization of Program Operation for Low Power Consumption in 3D Ferroelectric (Fe)-NAND Flash Memory
Myeongsang Yun, Gyuhyeon Lee, Gyunseok Ryu, Hyoungsoo Kim, Myounggon Kang
Electronics, 2024

25

An Optimized Device Structure with Improved Erase Operation within the Indium Gallium Zinc Oxide Channel in Three-Dimensional NAND Flash Applications
Seonjun Choi, Jin‐Seong Park, Myounggon Kang, Hong-sik Jung, Yun‐Heub Song
Electronics, 2024

26

Device Design and Reliability of GAA MBCFET
Myounggon Kang, Mi Chang, Yongsup Park, C. H. Noh, S. H. Hong, Byullee Park, Young-Woo Park, Younghun Jung, Wonsik Lim, G.H. Kim, Yongjae Lee, H. C. Yang, Dong-Won Shin, Jianguo Yang, K. H. Cho, Won-Cheol Jeong, HyungJun Cho, Woong Kwon, Dong Woo Kim, K. Rim, Jun‐Yeob Song
2024

27

Metal Oxide Resistive Memory Modeling with Physical Current Equation
Jongwon Lee, Yun-Jae Kim, Myounggon Kang
2024

28

Effects of Parenting Stress and Health Promotion Behavior of Parents of Disabled Children on Quality of Life
Myounggon Kang, Kyeong-Mi Kim, Nam‐Hae Jung, Moon-Young Chang
Journal of Korean Society of Sensory Integration Therapists, 2024

29

3D NAND Flash Memory에 Ferroelectric Material을사용한 Current Path 개선
이지환, 이재우, 강명곤
전기전자학회논문지, 2023

30

Selective Erase Operation for Multiple Strings of 3D Ferroelectric (Fe)-NAND Flash Memory
Gyunseok Ryu, Myounggon Kang
IEEE Electron Device Letters, 2023