Filament Geometry Induced Bipolar, Complementary, and Unipolar Resistive Switching under the Same Set Current Compliance in Pt/SiOx/TiN
임동혁, 김가연, 송진호, 정광식, 고대홍, 조만호
SCIENTIFIC REPORTS, 2015
72
Crystallinity of silicon films grown on carbon fibers by very high frequency plasma enhanced chemical vapor deposition
Chae, E (Chae, Eulyong), Lee, K (Lee, Kyumin), Lee, H (Lee, Hwan), 고대홍, Jeong, H (Jeong, Hongsik), 손현철
THIN SOLID FILMS, 2015
73
Improvement of reliability and speed of phase change memory devices with N7.9(Ge46.9Bi7.2Te45.9) films
박정희, 김선욱, 김정훈, 고대홍, Z. Wu, S, L. Cho, D. Ahn, D. H. Ahn, J. M. Lee, S. W. Nam
AIP ADVANCES, 2015
74
Comparison of Strain in GaN-Based Blue Light-Emitting Diode Grown on Silicon(111) and Sapphire Substrates
전기성, J. H. Sung, M. W. Lee, H. Y. Song, E. A. Lee, S. O. Kim, H. J. Choi, H. Y. Shin, W. H. Park, Y. I. Jang, M. G. Kang, Y. H. Choi, J. S. Lee, 고대홍, H. Y. Ryu
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2015
75
Characterization of residual strain in epitaxial Ge layers grown in sub-100 nm width SiO2 trench arrays