발행물
컨퍼런스
The 24th Korean Conference on Semiconductors
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Stabilization of tetragonal phase in Hf0.5Zr0.5O2 thin films induced by low deposition temperature during atomic layer deposition
Involvement of an intermediate nonpolar phase during polarization switching in the Hf0.4Zr0.6O2 thin Films
Diode Characteristics of the Pt/Al2O3/SrTiO3 Structure with Two-Dimensional Electron Gas and Its Time-Dependent Resistance Evolution
Non-hysteretic Negative Capacitance in Al2O3/BaTiO3 Bilayers
Study on ferroelectric switching kinetics in polycrystalline Hf0.5Zr0.5O2 films