발행물
컨퍼런스
The 21st Korean Conference on Semiconductors
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Stabilization of Negative Capacitance in Ferroelectric Thin Films
Evolution of Phases and Ferroelectric Properties of Thin Hf0.5Zr0.5O2 Films According to the Thickness and Annealing Temperature
The 10th joint symposium on ferroelectrics
The Factors that Determine the Ferroelectricity in Thin Hf0.5Zr0.5O2 Films
Grain size engineering for ferroelectric Hf0.5Zr0.5O2 films with Al2O3 inter-layer
The 20th Korean Conference on Semiconductors
The effects of grain size on the electrical properties of ferroelectric Hf1-xZrxO2 thin films