발행물
컨퍼런스
ESSCIRC-ESSDERC 2016
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Comparison of hafnia and PZT based ferroelectrics for future non-volatile FRAM applications
ISAF/ECAPD/PFM Conference 2016
Wake-up behavior comparison between PZT and HfO2 based ferroelectrics
Structural Root Causes of Ferroelectricity in Doped Hafnium Oxide
Examination on the effects of various sputter deposition conditions on ferroelectric Hf0.5Zr0.5O2 films
Study on the Ferroelectric Switching Kinetics of Hf0.5Zr0.5O2 films after wake-up effect