발행물
컨퍼런스
제 20회 반도체 학술대회
,
Examination on the Feroelectric Properties and Reliability of HfxZr1-xO2 Films on Ir Substrate
The effects of Grain Size on the Electrical Properties of Ferroelectric Hf1-xZrxO2 Thin Films
The 8th Asian Meeting on Ferroelectrics
Examination on the ferroelectricity of HfxZr1-xO2 thin film on various substrates
Direct Observation of Transient Negative Capacitance in Switching Domains of Ferroelectric/Dielectric Bi-layer Structure
Investigation on ferroelectric properties of HfxZr1-xO2 thin film with various compositions