발행물

전체 논문

354

291

Negative Capacitance FinFET With Sub-20-mV/decade Subthreshold Slope and Minimal Hysteresis of 0.48 V
신창환, 이재우, 고은아
IEEE ELECTRON DEVICE LETTERS, 2017

292

Effective Schottky Barrier Height Lowering of Metal/n-Ge with a TiO2/GeO2 Interlayer Stack
Hyun-Yong Yu, Joon Hyung Shim, 신창환, Byung Jin Cho, Yujin Seo, June Park, Seung-Hwan Kim, Sun-Woo Kim, Gwang-Sik Kim
ACS APPLIED MATERIALS INTERFACES, 2016

293

Vertical Tunnel FET: Design Optimization With Triple Metal-Gate Layers
신창환, 박정동, 이현재, 고은아
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016

294

3-D Quasi-Atomistic Model for Line Edge Roughness in Nonplanar MOSFETs
신창환, 오상헌
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016

295

Design for Variation-Immunity in Sub-10-nm Stacked-Nanowire FETs to Suppress LER-induced Random Variations
신창환, 이현재, 박진영, 오상헌
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016

296

Performance Booster for Vertical Tunnel Field-Effect Transistor: Field-Enhanced High-kappa Layer
신창환, 박정동, 이현재
IEEE ELECTRON DEVICE LETTERS, 2016

297

Random Dopant Fluctuation-Induced Threshold Voltage Variation-Immune Ge FinFET With Metal-Interlayer-Semiconductor Source/Drain
유현용, 조병진, 김종국, 이현재, 신창환, 김광식, 김정규, 신창호
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016

298

Experimental evidence of negative quantum capacitance in topological insulator for sub-60-mV/decade steep switching device
신창환, 김태근, 유현용, 박준, 이현재, 최현우
APPLIED PHYSICS LETTERS, 2016

299

Study of Work-Function Variation in High-kappa/Metal-Gate Gate-All-Around Nanowire MOSFET
신창환, 박정동, 이영택, 남효현
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016

300

Effect of Metal Nitride on Contact Resistivity of Metal-Interlayer-Ge Source/Drain in Sub-10-nm n-Type Ge FinFET
IEEE ELECTRON DEVICE LETTERS, 2016