신창환 교수 연구실
연구실 정보 수정하기
홈
기본 정보
연구 영역
프로젝트
발행물
구성원
발행물
논문
저서
컨퍼런스
전체 논문
354
필터 설정하기
291
Negative Capacitance FinFET With Sub-20-mV/decade Subthreshold Slope and Minimal Hysteresis of 0.48 V
신창환, 이재우, 고은아
IEEE ELECTRON DEVICE LETTERS, 2017
292
Effective Schottky Barrier Height Lowering of Metal/n-Ge with a TiO2/GeO2 Interlayer Stack
Hyun-Yong Yu, Joon Hyung Shim, 신창환, Byung Jin Cho, Yujin Seo, June Park, Seung-Hwan Kim, Sun-Woo Kim, Gwang-Sik Kim
ACS APPLIED MATERIALS INTERFACES, 2016
293
Vertical Tunnel FET: Design Optimization With Triple Metal-Gate Layers
신창환, 박정동, 이현재, 고은아
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016
294
3-D Quasi-Atomistic Model for Line Edge Roughness in Nonplanar MOSFETs
신창환, 오상헌
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016
295
Design for Variation-Immunity in Sub-10-nm Stacked-Nanowire FETs to Suppress LER-induced Random Variations
신창환, 이현재, 박진영, 오상헌
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016
296
Performance Booster for Vertical Tunnel Field-Effect Transistor: Field-Enhanced High-kappa Layer
신창환, 박정동, 이현재
IEEE ELECTRON DEVICE LETTERS, 2016
297
Random Dopant Fluctuation-Induced Threshold Voltage Variation-Immune Ge FinFET With Metal-Interlayer-Semiconductor Source/Drain
유현용, 조병진, 김종국, 이현재, 신창환, 김광식, 김정규, 신창호
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016
298
Experimental evidence of negative quantum capacitance in topological insulator for sub-60-mV/decade steep switching device
신창환, 김태근, 유현용, 박준, 이현재, 최현우
APPLIED PHYSICS LETTERS, 2016
299
Study of Work-Function Variation in High-kappa/Metal-Gate Gate-All-Around Nanowire MOSFET
신창환, 박정동, 이영택, 남효현
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016
300
Effect of Metal Nitride on Contact Resistivity of Metal-Interlayer-Ge Source/Drain in Sub-10-nm n-Type Ge FinFET
IEEE ELECTRON DEVICE LETTERS, 2016
21
22
23
24
25
26
27
28
29
30