발행물

전체 논문

291

211

Broad Phase Transition of Fluorite-Structured Ferroelectrics for Large Electrocaloric Effect
황철성, 박민혁, Thomas Mikolajick, Uwe Schroeder
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 201909

212

Thermodynamic and Kinetic Origins of Ferroelectricity in Fluorite Structure Oxides
박민혁, Uwe Schroeder, 황철성, Thomas Mikolajick, 이영환
ADVANCED ELECTRONIC MATERIALS, 201903

213

Nucleation-Limited Ferroelectric Orthorhombic Phase Formation in Hf0.5Zr0.5O2 Thin Films
이영환, 문태환, 박현우, 김해진, 현승담, 김백수, 김금도, 김준식, 박민혁, 노장호, 황철성, 유찬영, 이용빈
ADVANCED ELECTRONIC MATERIALS, 201902

214

Morphotropic Phase Boundary of Hf1-xZrxO2 Thin Films for Dynamic Random Access Memories
이영환, 김한준, 문태환, 황철성, 김유진, 김금도, 현승담, 박민혁
ACS APPLIED MATERIALS & INTERFACES, 201812

215

Physical Approach to Ferroelectric Impedance Spectroscopy: The Rayleigh Element
Tony Schenk, Claudia Richter, Milan Pesic, Michael Hoffmann, Uwe Schroeder, 박민혁, Thomas Mikolajick
PHYSICAL REVIEW APPLIED, 201812

216

Review and perspective on ferroelectric HfO<inf>2</inf>-based thin films for memory applications
박민혁, Uwe Schroeder, Thomas Mikolajick, 이영환, 황철성
MRS COMMUNICATIONS, 201809

217

Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM
Tony Schenk, Everett D. Grimley, Jacob L. Jones, James M. LeBeau, 박민혁, Thomas Mikolajick, Uwe Schroeder, Chris M. Fancher, Sam Frisone
MICROSCOPY AND MICROANALYSIS, 201808

218

Effect of Annealing Ferroelectric HfO2 Thin Films: In Situ, High Temperature X-Ray Diffraction
Park, MH (Park, Min Hyuk), Chung, CC (Chung, Ching-Chang), Schenk, T (Schenk, Tony), Richter, C (Richter, Claudia), Opsomer, K (Opsomer, Karl), Detavernier, C (Detavernier, C, Adelmann, C (Adelmann, Christo, Jones, JL (Jones, Jacob L.), Mikolajick, T (Mikolajick, Tho, Schroeder, U (Schroeder, Uwe)
ADVANCED ELECTRONIC MATERIALS, 201807

219

Ferroelectric hafnium oxide for ferroelectric random-access memories and ferroelectric field-effect transistors
Mikolajick, T (Mikolajick, Tho, Slesazeck, S (Slesazeck, Stefa, Park, MH (Park, Min Hyuk), Schroeder, U (Schroeder, Uwe)
MRS BULLETIN, 201805

220

Origin of Temperature-Dependent Ferroelectricity in Si-Doped HfO2
Park, MH (Park, Min Hyuk), Chung, CC (Chung, Ching-Chang), Schenk, T (Schenk, Tony), Richter, C (Richter, Claudia), Hoffmann, M (Hoffmann, Michael, Wirth, S (Wirth, Steffen), Jones, JL (Jones, Jacob L.), Mikolajick, T (Mikolajick, Tho, Schroeder, U (Schroeder, Uwe)
ADVANCED ELECTRONIC MATERIALS, 201804