발행물

전체 논문

75

31

Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs
J.-Y. Park, D.-I. Moon, G.-B. Lee, Y.-K. Choi
IEEE Trans. Electron Devices, 2020

32

Analysis of Damage Curing in a MOSFET with Joule Heat Generated by Forward Junction Current at the Source and Drain
G.-B. Lee, C.-K. Kim, T. Bang, M.-S. Yoo, J.-Y. Park, Y.-K. Choi*
Microelectron. Reliab., 2020

33

A Comparative Study of the Curing Effects of Local and Global Thermal Annealing on a FinFET
J.-Y. Park, G.-B. Lee, Y.-K. Choi*
IEEE J. Electron Devices Soc., 2019

34

Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs
J.-Y. Park, D.-H. Yun, Y.-K. Choi*
IEEE Electron Device Lett., 2019

35

A Study of High-Temperature Effects on an Asymmetrically Doped Vertical Pillar-Type Field-Effect Transistor
J.-K. Han, J. Hur, W.-K. Kim, J.-Y. Park, S.-W. Lee, S.-Y. Kim, J.-M. Yu, Y.-K. Choi*
IEEE Trans. Nanotechnol., 2019

36

Demonstration of Thermally-Assisted Programming with High Speed and Improved Reliability for Junctionless Nanowire NOR Flash Memory
J.-M. Yu, J.-Y. Park, G.-B. Lee, J.-K. Han, M.-S. Kim, J. Hur, D.-H. Yun, S.-Y. Kim, Y.-K. Choi*
IEEE Trans. Nanotechnol., 2019

37

Nanoscale FET-Based Transduction Toward Sensitive Extended-Gate Biosensors
J. Kwon, B.-H. Lee, S.-Y. Kim, J.-Y. Park, H. Bae, Y.-K. Choi*, J.-H. Ahn*
ACS Sens., 2019

38

Suppression of Self-Heating Effects in 3-D V-NAND Flash Memory Using a Plugged Pillar-Shaped Heat Sink
J.-Y. Park, D.-H. Yun, S.-Y. Kim, Y.-K. Choi*
IEEE Electron Device Lett., 2019

39

Electro-Thermal Erasing at 104-Fold Faster Speeds in Charge-Trap Flash Memory
M.-S. Kim, D.-C. Ahn, J.-Y. Park, M. Seo, S.-Y. Kim, W.-K. Kim, D.-H. Yun, Y.-K. Choi*
IEEE Electron Device Lett., 2019

40

Power Reduction for Recovery of a FinFET by Electrothermal Annealing
J.-K. Han, J.-Y. Park, Y.-K. Choi*
Solid-State Electron., 2019