발행물

전체 논문

75

41

A Recoverable Synapse Device Using a Three-Dimensional Silicon Transistor
J. Hur, B. C. Jang, J. Park, D.-I. Moon, H. Bae, J.-Y. Park, G.-H. Kim, S.-B. Jeon, M. Seo, S. Kim, S.-Y. Choi*, Y.-K. Choi*
Adv. Funct. Mater., 2018

42

On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments
J.-Y. Park, W.-G. Kim, H. Bae, I. K. Jin, D.-J. Kim, H. Im, I.-W. Tcho, Y.-K. Choi*
Sci. Rep., 2018

43

Electrothermal Annealing to Enhance the Electrical Performance of an Exfoliated MoS2 Field-Effect Transistor
J.-K. Han, J.-Y. Park, C.-K. Kim, J. H. Kwon, M.-S. Kim, B.-W. Hwang, D.-J. Kim, K. C. Choi, Y.-K. Choi*
IEEE Electron Device Lett., 2018

44

Self-Powered Data Erasing of Nanoscale Flash Memory by Triboelectricity
I. K. Jin, J.-Y. Park, B.-H. Lee, S.-B. Jeon, I.-W. Tcho, S.-J. Park, W.-G. Kim, J.-K. Han, S.-W. Lee, S.-Y. Kim, H. Bae, D. Kim, Y.-K. Choi*
Nano Energy, 2018

45

Sanitization of Data in Nanoscale Flash Memory by Thermal Erasing and Reuse of Storage
J.-Y. Park, D.-I. Moon, S.-Y. Kim, H. Im, K. S. Chang, C. Jeong, Y.-K. Choi*
Phys. Status Solidi A-Appl. Mater., 2018

46

Demonstration of a Curable Nanowire FinFET Using Punchthrough Current to Repair Hot-Carrier Damage
J.-Y. Park, J. Hur, Y.-K. Choi*
IEEE Electron Device Lett., 2018

47

Localized Electrothermal Annealing with Nanowatt Power for a Silicon Nanowire Field-Effect Transistor
J.-Y. Park, B.-H. Lee, G.-B. Lee, H. Bae, Y.-K. Choi*
ACS Appl. Mater. Interfaces, 2018

48

A Comparative Study on Hot-Carrier Injection in 5-Story Vertically Integrated Inversion-Mode and Junctionless-Mode Gate-All-Around MOSFETs
S.-Y. Kim, B.-H. Lee, J. Hur, J.-Y. Park, S.-B. Jeon, S.-W. Lee, Y.-K. Choi*
IEEE Electron Device Lett., 2018

49

LF Noise Analysis for Trap Recovery in Gate Oxides Using Built-in Joule Heater
C.-H. Jeon, C.-K. Kim, J.-Y. Park, U.-S. Jeong, B.-H. Lee, K. R. Kim, Y.-K. Choi*
IEEE Trans. Electron Devices, 2017

50

Nano-Electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments
K.-M. Hwang, J.-Y. Park, H. Bae, S.-W. Lee, C.-K. Kim, M. Seo, H. Im, D.-H. Kim, S.-Y. Kim, G.-B. Lee, Y.-K. Choi*
ACS Nano, 2017