발행물

전체 논문

75

61

Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced from Hot-Carrier Injection
J.-Y. Park, D.-I. Moon, M.-L. Seol, C.-K. Kim, C.-H. Jeon, H. Bae, T. Bang, Y.-K. Choi*
IEEE Trans. Electron Devices, 2016

62

Joule Heating to Enhance the Performance of a Gate-All-Around Silicon Nanowire Transistor
C.-H. Jeon, J.-Y. Park, M.-L. Seol, D.-I. Moon, J. Hur, H. Bae, S.-B. Jeon, Y.-K. Choi*
IEEE Trans. Electron Devices, 2016

63

Ultra-Fast Erase Method of SONOS Flash Memory by Instantaneous Thermal Excitation
D.-C. Ahn, M.-L. Seol, J. Hur, D.-I. Moon, B.-H. Lee, J.-W. Han, J.-Y. Park, S.-B. Jeon, Y.-K. Choi*
IEEE Electron Device Lett., 2016

64

Controllable Electrical and Physical Breakdown of Poly-Crystalline Silicon Nanowires by Thermally Assisted Electromigration
D.-I. Moon, M.-L. Seol, C.-H. Jeon, G.-J. Jeon, J.-W. Han, C.-K. Kim, S.-J. Park, H. C. Lee, Y.-K. Choi*
Sci. Rep., 2016

65

Vertically Integrated Multiple Nanowire Field Effect Transistor
B.-H. Lee, M.-H. Kang, D.-C. Ahn, J.-Y. Park, T. Bang, S.-B. Jeon, J. Hur, D. Lee, Y.-K. Choi*
Nano Lett., 2015

66

Enhancement of SiO2 Uniformity by High-Pressure Deuterium Annealing
Y.-S. Kim, D.-H. Jung, H.-J. Park, J.-W. Yeon, T.-H. Kil, J.-Y. Park*
Trans. Electr. Electron. Mater., 2024

67

Fabrication of Enclosed-Layout Transistors (ELTs) through Low-Temperature Deuterium Annealing and Their Electrical Characterizations
D.-H. Wang, D.-H. Kim, T.-H. Kil, J.-Y. Yeon, Y.-S. Kim, J.-Y. Park*
Trans. Electr. Electron. Mater., 2024

68

Improvement of Device Reliability and Variability using High Pressure Deuterium Annealing
D.-H. Jung, S.-S. Yoon, J.-Y. Ku, D.-H. Wang, K.-S. Lee, J.-Y. Park*
Trans. Electr. Electron. Mater., 2023

69

Electro-Thermal Annealing of 3D NAND Flash Memory Using Through-Silicon Via for Improved Heat Distribution
Y.-S. Son, K.-S. Lee, Y.-J. Kim, J.-Y. Park*
J. Korean Inst. Electr. Electron. Mater. Eng., 2023

70

Device Optimization of Bulk FinFET with Vacuum Gate Spacer and the Suppression of Short-Channel Effects
J.-Y. Yeon, K.-S. Lee, S.-S. Yoon, J.-W. Yeon, H. Bae*, J.-Y. Park*
J. Korean Inst. Electr. Electron. Mater. Eng., 2022