발행물

전체 논문

75

51

Investigation of Self-Heating Effects in Gate-All-Around MOSFETs with Vertically Stacked Multiple Silicon Nanowire Channels
J.-Y. Park, B.-H. Lee, K. S. Chang, D. U. Kim, C. Jeong, C.-K. Kim, H. Bae, Y.-K. Choi*
IEEE Trans. Electron Devices, 2017

52

Functional Circuitry on Commercial Fabric via Textile-Compatible Nanoscale Film Coating Process for Fibertronics
H. Bae, B. C. Jang, H. Park, S.-H. Jung, H. M. Lee, J.-Y. Park, S.-B. Jeon, G. Son, K. Yu, S.-G. Im, S.-Y. Choi*, Y.-K. Choi*
Nano Lett.,

53

A Novel Technique for Curing Hot-Carrier-Induced Damage by Utilizing the Forward Current of the PN-Junction in a MOSFET
G.-B. Lee, C.-K. Kim, J.-Y. Park, T. Bang, H. Bae, S.-Y. Kim, S.-W. Ryu, Y.-K. Choi*
IEEE Electron Device Lett., 2017

54

Electro-Thermal Annealing Method for Recovery of Cyclic Bending Stress in Flexible a-IGZO TFTs
M. K. Lee, C.-K. Kim, E. Kim, J. W. Park, M.-L. Seol, J.-Y. Park, Y.-K. Choi, S.-H. K. Park*, K. C. Choi*
IEEE Trans. Electron Devices, 2017

55

Improved Technique for Extraction of Effective Mobility by Considering Gate Bias-Dependent Inversion Charges in a Floating-Body Si/SiGe pMOSFET
H. Bae, T. Bang, C.-K. Kim, J. Hur, S. Kim, C.-H. Jeon, J.-Y. Park, D.-C. Ahn, G.-H. Kim, Y. Son, J.-H. Lee, Y.-T. Kim, S.-W. Ryu, Y.-K. Choi*
J. Nanosci. Nanotechnol., 2017

56

Physically Transient Memory on a Rapidly Dissoluble Paper for Security Application
H. Bae, B.-H. Lee, D. Lee, M.-L. Seol, D. Kim, J.-W. Han, C.-K. Kim, S.-B. Jeon, D.-C. Ahn, S.-J. Park, J.-Y. Park, Y.-K. Choi*
Sci. Rep., 2016

57

Threshold Voltage Tuning Technique in Gate-All-Around MOSFETs by Utilizing Gate Electrode with Potential Distribution
J.-Y. Park, H. Bae, D.-I. Moon, C.-H. Jeon, Y.-K. Choi*
IEEE Electron Device Lett., 2016

58

Three-Dimensional Fin-Structured Semiconducting Carbon Nanotube Network Transistor
D. Lee, B.-H. Lee, J. Yoon, D.-C. Ahn, J.-Y. Park, J. Hur, M.-S. Kim, S.-B. Jeon, M.-H. Kang, K. Kim, M. Lim, S.-J. Choi*, Y.-K. Choi*
ACS Na,

59

Electrothermal Annealing (ETA) Method to Enhance the Electrical Performance of Amorphous-Oxide-Semiconductor (AOS) Thin-Film Transistors (TFTs)
C.-K. Kim, E. Kim, M. K. Lee, J.-Y. Park, M.-L. Seol, H. Bae, T. Bang, S.-B. Jeon, S. Jun, S.-H. Park, K. C. Choi*, Y.-K. Choi*
ACS Appl. Mater. Interfaces, 2016

60

Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs
J.-Y. Park, D.-I. Moon, H. Bae, Y. T. Roh, M.-L. Seol, B.-H. Lee, C.-H. Jeon, H. C. Lee, Y.-K. Choi*
IEEE Electron Device Lett., 2016