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21
주사전자현미경 렌즈의 해석을 통한 최적의 빔 특성 연구
서울과학기술대학교, 김동환
대한기계학회논문집 A, 201501
22
Step-out detection and error compensation for a micro-stepper motor using current feedback
MOON, S, KIM, DH
MECHATRONICS, 201404
23
Raster scan waveform compensation control for enhancing the orthogonality of images in SEM
Kim, SJ, Joo, W, Kim, DH
MICROSCOPY, 201308
24
An Approach to Reducing the Distortion Caused by Vibration in Scanning Electron Microscope Images
DongHwanKim, Kwang OhJung, SeungJaeKim
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SP, 201201
25
Scanning electron microscope image enhancement using spread spectrum through dither signal imposition
Jung, KO, Joo, W, Kim, DH
JOURNAL OF ELECTRON MICROSCOPY, 201112
26
A new landmark design for localization and orientation of an autonomously moving theatrical stage
Dong Hwan Kim, Jae Hyun Lee, Jeong Min Lee, Young Jin Kim
MECHATRONICS, 201109
27
A dither signal imposition to enhance an image in a scanning electron microscope
Jung, KO, Kim, DH
MICROELECTRONIC ENGINEERING, 201108
28
Investigation of field-emitted electron beam behaviors using a line collector in a triode electron gun system
Kim, CS, Kim, DH, Kim, IH, Jang, DY, Yim, CH, Ahn, SH, Han, DC
MICROELECTRONIC ENGINEERING, 201011
29
Image improvement with modified scanning waves and noise reduction in a scanning electron microscope
Dong HwanKim, SeungJaeKim, SeKyuOh
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SP, 201007
30
Optimization of optical lens-controlled scanning electron microscopic resolution using generalized regression neural network and genetic algorithm
Kim, B, Kwon, S, Kim, DH
EXPERT SYSTEMS WITH APPLICATIONS, 201001
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