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31
Numerical analysis for verifying the performance of lens system in a scanning electron microscope
Dong HwanKim, KeunPark, ManJinPark, Hyun-WooJung, DongYoungJang
OPTIK, 201001
32
MODELING OF THIN FILM PROCESS DATA USING A GENETIC ALGORITHM-OPTIMIZED INITIAL WEIGHT OF BACKPROPAGATION NEURAL NETWORK
Byungwhan Kim, Hwajune Lee, Donghwan Kim
Applied Artificial Intelligence, 200902
33
Neural Network Model of Plasma Charging Damage on MOSFET Device
Byungwhan Kim, Hwa Jun Lee, Donghwan Kim
MATERIALS AND MANUFACTURING PROCESSES, 200902
34
Mechanism, control, and visual management of a jumping robot
김동환, 이재현, 오세규, 노승희, 김인호
MECHATRONICS, 200812
35
Design and analysis of a thermionic SEM column using 3D finite element analysis
M. J. PARK, K. PARK, D. Y. JANG, 김동환
Phys. Procedia, 200808
36
Ex-situ plasma diagnosis by combining scanning electron microscope, wavelet, and neural network
KIM, B, UH, HS, KIM, D
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 200806
37
ADVANCED NEURAL NETWORK MODEL OF PLASMA-DRIVEN INTEGRATED CIRCUIT
김동환, CHANGKI MIN, BYUNGSHAN KIM
MATERIAL SCIENCE IN SEMICONDUCTOR PROCESSING, 200805
38
Advanced neural network model of plasma-driven integrated circuit process data
Kim, B, Min, C, Kim, D
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 200712
39
소형주사전자현미경용 전자광학계의 개발
김일해, 김동환, 장동영, 한동철, 박만진
한국생산제조시스템학회지, 200710
40
DIGNOSIS OF PLASMA PROCESSED X-RAY PHOTOELECTRON SPECTROSCOPY USING PRINCIPAL COMPONENT ANALYSIS AND NEURAL NETWORK
김동환, 김병환, 김수연
DCDIS SERIES B, 200706
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