발행물
컨퍼런스
2002년도 추계학술연구발표회
2002
,
HFO2/SI 시스템의 계면산화막 및 고유전박막의 특성연구
AM. VAC. SOC.
THE DISTRIBUTION OF GE DURING OXIDATION OF EPI-SI1-XGEX
COPARISON OF REACTIVE SPUTTERED OXIDE FILMS FROM ZR AND HF METAL TARGETS WITH POLY-SI OF POLY-SIGE G
A STUDY OF THE MICRO STRUCTURE AND ELECTRICAL PROPERTIES OF THE REOXIDIZED HFO2 UPON ANNEALING METHODS
SOLID STATE DEVICE AND MATERIALS
PREVENTION OF DEGRADATION IN POLY SI1-XGEX/HIGH K STRUCTURE BY CONTROLLING GE CONTENT IN POLY SI1-XG FILMS