발행물
컨퍼런스
MRS 2006 SPRING
2006
,
NITROGEN INCORPORATION IN GE2SB2TE5 FILMS BY N2+ ION IMPLANTATION
A STUDY ON THE PHASE TRANSFORMATION BEHAVIOR AND MICROSTRUCTURES OF N-DOPED GE2SB2+XTE5 THIN FILMS FOR THE APPLICATION TO PHASE CHANGE MEMORY DEVICES
CHARACTERIZATION OF GE2SB2TE5 GROWN BY THE METHOD OF AN ION BEAM SPUTTERING DEPOSITION
MRS 2005 FALL
2005
THERMAL STABILITY OF HF-SILICATE FILMS ON SI(100) GROWN BY ATOMIC LAYER DEPOSITION
2005 KPS FALL MEETING
CHARACTERIZATION OF GE2SB2TE5 GROWN BY THE MEHOD OF ION BEAM SPUTTERING DEPOSITION