발행물
컨퍼런스
NANO KOREA 2013 Symposium
2013
,
Stress-strain measurement of W-C-N thin film by Continuous Nano-Indentation
The 16th International Symposium on the Physics of Semiconductors and Applications (ISPSA-XVI)
Nano-mechanics of Hf and HfO2 thin films measured by nano-indenter according to oxidation during annealing process
Relationship between the crust layer and its pop-in load force for atmospheric plasma exposed HDI-PR by analyzing the “pop-in” point
The International Forum on Functional Materials (IFFM)
Nano-mechanical Analysis of UV treated Ag thin film as the proposal of oxidation model using nano-tribology
Effect of Atmospheric Pressure Oxygen Plasma treatment of Crust layer for HDI-PR using a Nanotribology Analysis