발행물
컨퍼런스
Sanghyeon Baeg and William A. Rogers
1994
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Hybrid Design For Testability Combining Scan and Clock Line Control and Method For Test Generation
Jeonghwan Kim, and Sanghyeon Baeg
2020
시스템 레벨에서의 DDR4의 컴포넌트 취약성 비교에 따른 Row Hammer 고찰
Junhyeong Kwon, and Sanghyeon Baeg
2019
Variation of I/O Margin According to the High Temperature Operating Experiment of DDR4 DIMM
Youngbin Chang and Sanghyeon Baeg
2018
Micro-probing을 통한 DC 측정 방법에 대한 고찰
2018 Korea Test Conference
Change of I/O margin according to data pattern in DDR4 DIMM