발행물
컨퍼런스
SoC Conference at Inha University
2010
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Power Saving Model with the Conversion of Parallel Interface to Serial Interface
The 10th Korea Test Conference
2009
Ground Pin Removal Method Implementations for Delay Test in Probe Card Environment
The 9th Korea Test Conference
2008
AC Coupling Capacitor Test using Hysteresis Buffer
The 15th Korean Conference on Semiconductors
Ground bounce effects on the Devices under NBTI stress
The 8th Korea Test Conference
2007
Ground Bounce Analysis in Impact of NBTI on SRAM Cell