발행물
컨퍼런스
2017 Korea Test Conference
2017
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DDR4 SRAM에서 DQS에 따른 I/O 마진 값의 변화
2016 Korea Test Conference
2016
Data Margin impact of the 800Mhz DDR3 DIMM pad wear
2015 Korea Test Conference
2015
Retention Test of DIMM Module by Local Heating
2015 The Institute of Electronics and Information Engineers Conference
Retention Time Test on Heavy Ion-Induced SDRAM Devices
The Institute of Electronics and Information Engineers Conference