발행물
컨퍼런스
The Korean Institute of Electrical and Electronic Material Engineers (KIEEME) 2025
2020
,
A study on the influence of chlorine concentration on electrical stability of IGZO thin-film transistors
A study on cryogenic characterization of IGZO thin-film transistors
Analysis of low-temperature crystallization of ferroelectric ALD-HZO thin films with Avrami constant calculation
Comprehensive analysis of the effects of metal precursors and oxygen sources on ferroelectric ALD-HZO thin films
A study on the voltage-dependent ferroelectric characterization of ALD-HZO thin films under cryogenic conditions