2014

,

Void Formations in GeSbTe Based Phase Change Memory

2014

,

Removal of Interfacial Layer in HfO2 Gate Stack by Post-Gate Cleaning Using NF3/NH3 Dry Cleaning Technique

2014

,

Sub-100 nm Regrown S/D Gate-Last In0.7Ga0.3As QW MOSFETs with mn,eff > 5,500 cm2/V-s

2014

,

The use of nanobeam electron diffraction in characterizing strain in FinFETs with SiGe stressors

2014

,

Changes in surface chemical structure of BF3 plasma doped Si0.7Ge0.3 films