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컨퍼런스
2000 SYMPOSIUM ON VLSI TECHNOLOGY
2000
,
HIGH PERFORMANCE PMOSFETS WITH NI(SIXGE1-X)/POLY-SI0.8GE0.2 GATE
E-MRS IUMRS ICEM 2000
A STUDY ON THE MICROSTRUCTURES AND ELECTRICAL PROPERTIES OF CEO2 FILMS FOR GATE DIELECTRICS APPLICAT
MAT. RES. SOC. SYMP. PROC.
THE PHYSICAL AND ELECTRICAL PROPERTIES OF POLYCRYSTALLINE SI1-XGEX AS A GATE ELECTRODE MATERIAL FORU
MAT. RES. SOC. SYMP. PROC
THE STUDY OF THE MICROSTRUCTURE AND ELECTRICAL PROPERTIES OF CEO2 THIN FILM DEPOSITED BY REACTIVE DC
요업학회 추계 연구 발표회
산소열처리에 따른 ZRO2 게치트 유전막의 특성