발행물
컨퍼런스
Korean international semiconductor conference on manufacturing technology 2022
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Impedance Measurement of SiC Using Multi-Frequency Analysis for Real-Time Control of the Focus Ring in Plasma Processing
The 20th international Symposium on Microelectronics and Packagin
Development of high ion density and uniformity plasma source for large scale descum processing
제63회 한국진공학회 하계정기학술대회
그리드를 이용한 Ultra-low electron temperature 플라즈마 생성 및 전자 빔의 제어에 관한 연구
A study on the measurement of focus ring thickness in the inductively coupled plasma
산소 플라즈마 전자 빔을 이용한 Photoresist etching