발행물
컨퍼런스
Korean international semiconductor conference on manufacturing technology 2022
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Improvement of spatial distribution measurement of plasma parameters through asymmetric double Langmuir probe
Enhancement of photoresist etching by controlling the impedance between bias electrode and ground in an inductively coupled plasma
Modeling of electron temperature and electron density in ultra-low electron temperature
Electron-assisted PR etching in an inductivley coupled oxygen plasma via low-energy electron beam
A study on MoS2 etching using ultra-low electron temperature plasma