발행물
컨퍼런스
Electrochemical Society meeting
2007
,
Effect of Particle Deposition and Wet/Dry Cleaning Methods on Particle Removal Efficiency
Quantitative Measurment of Pattern Collapse and Particle Removal Force
Removal of Organic Wax and Particles on Silicon after Batch type Polishing by Ozonated DI Water
Characteristics of High Power Laser Shock Waves and Their Cleaning Performance
2007 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices
Effect of a guard-ring, on the leakage current in a Si-PIN X-ray detector for a single photon counting sensor