발행물

전체 논문

109

11

DDR4 Data Channel Failure Due to DC Offset Caused by Intermittent Solder Ball Fracture in FBGA Package
백상현
IEEE ACCESS, 2021

12

A theoretical and experimental investigation of Bragg's rule for energy-loss straggling in low mean energy loss regime in air and its constituents
백상현
VACUUM, 2021

13

Failure Analysis of Galaxy S7 Edge Smartphone Using Neutron Radiation
백상현
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020

14

시스템 레벨에서의 DDR4의 컴포넌트 취약성 비교를 통한 Row Hammer 고찰
백상현
2020 Korea Test Conference, 2020

15

FBGA solder ball defect e ff ect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitor
백상현
MICROELECTRONICS RELIABILITY, 2020

16

Energy straggling and an experimental investigation of Bragg's rule for Am-241 alpha particles in air and its constituents
백상현
RADIATION PHYSICS AND CHEMISTRY, 2020

17

Radiation reliability benefit of area-optimized interleaved flip-flop layout in 28 nm technology
백상현
MICROELECTRONICS RELIABILITY, 2019

18

Architectural design tradeoffs in SRAM-based TCAMs
백상현
IEICE ELECTRONICS EXPRESS, 2019

19

Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers
백상현
MICROELECTRONICS RELIABILITY, 2019

20

Failure signature analysis of power-opens in DDR3 SDRAMs
백상현
MICROELECTRONICS RELIABILITY, 2018