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31
Experiments and root cause analysis for active-precharge hammering fault in DDR3 SDRAM under 3x nm technology
Kyungbae Park, Chulseung Lim, Donghyuk Yun, Sanghyeon Baeg
Journal of Microelectronics Reliability, 2016
32
Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology
Habin Wang, N. Mahatme, Li Chen, M. Newton, Y.-Q.Li, R. Liu, M. Chen, B.L. Bhuva, K. Lilja, S.-J. Wen, R. Wong, R. Fung, Sanghyeon Baeg
IEEE Trans. Nucl. Sci.,
33
Supply Voltage Dependence of Heavy Ion Induced SEEs on 65 nm CMOS Bulk SRAMs
Q. Wu, Y.-Q.Li, L. Chen, A.-L. He, G. Guo, Sanghyeon Baeg, H.-B. Wang, S.-J. Wen, R. Wong, S. Allman, R. Fung
IEEE Trans. Nucl. Sci., 2015
34
An SEU-Tolerant DICE Latch Design With Feedback Transistors
Haibin Wang, Bhuva Bharat L, Shi-Jie Wen, Richard Wong, Sanghyeon Baeg, Nihaar Mahatme, Yuanqing Li, Rui Liu, Chen Li
IEEE Trans. Nucl. Sci., 2015
35
Stuck Bits Study in DDR3 SDRAMs using 45-MeV Proton Beam
Chulseung Lim, Hyunsoo Jeong, Geunyong Bak, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
IEEE Trans. Nucl. Sci., 2015
36
Single Event Resilient Dynamic Logic Designs
Haibin Wang, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi
Journal of Electronic Testing: Theory and Applications, 2014
37
Novel Error Detection Scheme with the Harmonious usage of Parity codes, Well-taps, and Interleaving Distance
Sang Hoon Jeon, Soonyoung Lee, Sanghyeon Baeg, Ilgon Kim, Gunrae Kim
IEEE Trans. Nucl. Sci., 2014
38
Soft Error Tolerant Content Addressable Memories (CAM) Using Error Detection Codes and Duplication
Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, ShiJie Wen, Richard Wong
Microprocessors and Microsystems, 2013
39
An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory
Syed Mohsin Abbas, Soonyoung Lee, Sanghyeon Baeg, Sungju Park
IEEE Trans. on Computers, 2013
40
Memory Reliability Analysis for Multiple Block Effect of Soft Errors
Soonyoung Lee, Sanghoon Jeon, Sanghyeon Baeg, Dongho Lee
IEEE Trans. Nucl. Sci., 2013
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