Experimental Exploitation of Random and Deterministic Data Patterns for Stringent DDR4 I/O Timing Margins

Clocked Low Power Rail-to-Rail Sense Amplifier for Ternary Content Addressable Memory (TCAM) Application

Introduction of Soft Errors in Semiconductor Memories

Analysis Simultaneously Switching Density Using Ring Oscillator

AC Coupling Capacitor Test using Hysteresis Buffer

Characteristic and Performance of AC-Coupled Channel