발행물

논문
특허
저서
컨퍼런스

전체 논문

109

61

MCU Effects on SER Modeling with Memory Architecture Parameters
백상현
International School on the Effects of Radiation on Embedded Systems for Space Applications, 2012

62

Memory Reliability Model for Accumulated and Clustered Soft Errors
백상현, 이순영, Pedro Reviriego
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011

63

Mitigating the Effects of Large Multiple Cell Upsets (MCUs) in Memories
백상현, Juan Antonio Maestro, Pedro Reviriego, Shijie Wen, Richard Wong
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2011

64

DRAM failure cases under hot-carrier injection
백상현, Pierre Chia, ShiJie Wen, Richard Wong
Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium, 2011

65

Designing ad-hoc scrubbing sequences to improve memory reliability against soft errors
백상현, Pedro Reviriego, Juan Antonio Maestro
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE, 2011

66

AC-DC Factor Sensitivity for DRAM Components Lifetime under Hot-Carrier Injection
백상현, Hyeonwoo Nam, Pierre Chia, ShiJie Wen, Richard Wong
Reliability Physics Symposium (IRPS), 2011 IEEE International, 2011

67

Multiple Cell Upsets Tolerant Content-Addressable Memory
백상현, Syed Mohsin Abbas, Sungju Park
Reliability Physics Symposium (IRPS), 2011 IEEE International, 2011

68

Design Method of NOR-Type Comparison Circuit in CAM with Ground Bounce Noise Considerations
백상현, Changmin Jung, ShiJie Wen, Richard Wong
Quality Electronic Design (ISQED), 2011 12th International Symposium, 2011

69

Protection of Memories Suffering MCUs Through the Selection of the Optimal Interleaving Distance
백상현
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2010

70

Optimizing Scrubbing Sequences for Advanced Computer Memories
백상현
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2010