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전체 논문

109

71

Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals
백상현
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2010

72

반도체 메모리에서 발생하는 소프트에러에 대한 소개
백상현, 이순영
한국테스트협회논문집, 2010

73

A di/dt Compensation Technique in Delay Testing by Disconnecting Power Pins
백상현
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2009

74

Selection of the Optimal Interleaving Distance for Memories Suffering MCUs
백상현, Pedro Reviriego, Juan Antonio Maestro, Shijie Wen, Richard Wong
10th European Conference on Radiation Effects on Components and Systems, 2009

75

SRAM Interleaving Distance Selection With a Soft Error Failure Model
백상현
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2009

76

Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential Signaling
백상현
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2009

77

Analysis of Low Power Sensor Node Using Data Compression
백상현, 신효덕(Hyo-deok Shin, 안상욱(Sang-wook Ahn, 송태훈(Tae-hoon Song
8th IFAC International Conference on Fieldbuses and Networks in Industrial and Embedded Systems, 2009

78

Analysis of a Multiple Cell Upset Failure Model for Memories
백상현, Pedro Reviriego, Juan Antonio Maestro, ShiJie Wen, Richard Wong
SELSE 5 Workshop - Silicon Errors in Logic - System Effects, 2009

79

Hysteresis 버퍼를 이용한 AC 커플링 커패시터 테스트
백상현
한국테스트협회논문집, 2008

80

Ground bounce effects on the Devices under NBTI stress
백상현
한국 반도체 학술대회, 2008