발행물

전체 논문

398

41

In-situ TEM characterization of interfacial reaction in Sn-3.5Ag/electroless Ni(P) solder joint
Han-Byul Kang, Jee-Hwan Bae, Jeong-Won Yoon, Seung-Boo Jung, Jongwoo Park, Cheol-Woong Yang
Scripta Materialia, 2011.04

42

Sequential interfacial intermetallic compound formation of Cu6Sn5 and Ni3Sn4 between Sn-Ag-Cu solder and ENEPIG substrate during reflow process
Jeong-Won Yoon, Bo-In Noh, Jae-Hyun Yoon, Han-Byul Kang, Seung-Boo Jung
Journal of Alloys and Compounds, 2011.03

43

Effects of different kinds of underfills and temperature humidity treatments on drop reliability of board level packages
Bo-In Noh, Jeong-Won Yoon, Sang-Ok Ha, Seung-Boo Jung
Journal of Electronic Materials, 2011.02

44

Interfacial reaction between Au-Sn solder and Au/Ni-metallized Kovar
Jeong-Won Yoon, Bo-In Noh, Seung-Boo Jung
Journal of Materials Science: Materials in Electronics, 2011

45

Microstructure, Electrical Properties, and Electrochemical Migration of a Directly Printed Ag Pattern
Bo-In Noh, Jeong-Won Yoon, Kwang-Seok Kim, Young-Chul Lee, Seung-Boo Jung
Journal of Electronic Materials, 2011

46

Comparison of pressure-less Ag sinter-bonding properties with varying substrate surface finishes and Ag particle shapes and sizes: Influence of necking region and fracture behavior
Dong-Bok Lee, Jee-Yeon Park, Eun-Chae Noh, Chul-Min Oh, Jeong-Won Yoon
Journal of Materials Research and Technology, 2025.05

47

Transient Liquid-Phase Bonding using Sn/Ni/Sn Laminated Metal Preform for Power Device Packaging
Dong-Bok Lee, Young-Jin Seo, Jeong-Won Yoon
Journal of Electronic Materials, 2025.03

48

Metallurgical and mechanical properties of transient liquid phase bonded joints formed using Sn/Ni-foam hybrid preforms
Young-Jin Seo, Jeong-Won Yoon
Materials Chemistry and Physics, 2025.03

49

Impact of trimodal copper powder mixing on copper-sintered joints for power semiconductor packaging
Eun-Chae Noh, Byung-Suk Lee, Yong-Ho Ko, Jeong-Won Yoon
Materials Today Communications, 2025.02

50

Metallurgical reactions and high-temperature long-term reliability of the Sn-2.3Ag flip-chip solder bump
Eun-Su Jang, Jeong-Won Yoon
Microelectronic Engineering, 2025