발행물
컨퍼런스
Gaseous Electronics Conference
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Effect of rf bias frequency on plasma parameters in a remote inductively coupled plasma
Electrical diagnostic method on electron temperatureand ion density using the self-bias effect
The effect of step ionizations on the high energy electron temperature in an argon inductively coupled plasma
The effect of multi-step ionization on total energy loss in an argon inductive discharge
Correlation between distribution of wafer surface temperature and plasma parameters