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전체 논문
323
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201
Effect of Corrosion inhibitor, Benzotriazole(BTA), on Particle Adhesion in Cu CMP
박진구
KIEEME, 2005
202
Nanotribological Behavior of Cu Oxide and Silicon Tip
박진구
KIEEME, 2005
203
Effect of Slurry Chemistry on Cu CMP and Defects
박진구
SEMI Technology Symposium 2005, 2005
204
Effect of corrosion inhibitor (BTA) in Cu slurry on Cu polishing
박진구
PacRim-CMP 2005, 2005
205
Characterization of the Aluminum and PMMA CMP(chemical mechanical polishing) for transparent plastic display
박진구
PacRim-CMP 2005, 2005
206
Nanotribological behavior of Cu oxide with silicon tipoxide with silicon tip
박진구
PacRim-CMP 2005, 2005
207
The Effects of Chemicals in Post Cu CMP Cleaning Solutions on Silica and Alumina Particle Adhesion and Removal
박진구
PacRim-CMP 2005, 2005
208
The Effects of pH Adjustors in Post Cu CMP Cleaning Solutions on Particle Adhesion and Removal
박진구
The Electrochemical Society, 2005
209
Nanoscale Particles Removal on an Extreme Ultra-Violet Lithography(EUVL) Mask Layer by Lasershock Cleaning
박진구
The Electrochemical Society, 2005
210
Effects of Corrosion inbibitor, 1H-Benzotriazole(BTAH), on Particle Adhesion in CU CMP
박진구
The Electrochemical Society, 2005
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